Wang, Laung-Terng
Retrieve the information about Wang, Laung-Terng and his books on the go! Keep your project up to date with the ISBNdb book database searchable via API with 19 data points per book available.
Electronic Design Automation: Synthesis, Verification, and Test (ISSN)
VLSI Test Principles and Architectures: Design for Testability
VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
System-on-Chip Test Architectures: Nanometer Design for Testability (ISSN)
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